Researcher Detail

Researchers of Assessment, Interpretation and Utilization of Educational Testing

Other Researcher

Other Researcher

Dissertaion

2012/06/27

Presentation Report on the International Society for Bayesian Analysis World Meeting (ISBA2012)
- Assessing Prior Distributions for the Item Parameters in the Two-Parameter Logistic IRT Model -

In order to develop a test based on the Item Response Theory (IRT), it is necessary to collect response data from field testing and estimate the properties (item parameters) of each test item, such as discrimination and difficulty. Although estimating item parameters with a high degree of accuracy requires a vast amount of data, it is not infrequent that various restrictions and costs hinder t...

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2011/07/21

Report on the presentation at the International Meeting of the Psychometric Society (IMPS 2011):
"Setting a Target Test Information Function for Assembly of IRT-Based Classification Tests"

 This report describes the poster presentation entitled "Setting a Target Test Information Function for Assembly of IRT-Based Classification Tests," which was given at the International Meeting of the Psychometric Society (IMPS 2011) held in the Hong Kong Institute of Education, Hong Kong. More than 50 posters were presented in the session, and researchers in psychometrics engaged in active d...

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Report

2011/09/10

Report on participation in the 9th Convention of JART (Japan Association for Research on Testing) in Okayama

 This is a report on our participation in the 9th Convention of JART held at Benesse Corporation Headquarters and at Okayama University.  The theme of the Convention was "Testing in Education – Today and the Future." Two open symposia were held with the topics of "Dynamic Testing Technology to Watch over Children" and "Global Perspectives of Educational Testing Today and in the Future...

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2011/06/28

Report on the14th OECD/Japan Seminar: Education Reform in the 21st century
–Learning from "Strong Performers and Successful Reformers"-

  The 14th OECD/Japan Seminar co-sponsored by the OECD and MEXT was held on June 28th and 29th 2011. Every year, education ministers, policy-makers and researchers from Japan and all over the world gather to discuss the topical education policy issues. This year's seminar title was "Strong Performers and Successful Reformers - Lessons from PISA." This was 6 months after the results of PISA 2...

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World Watch

2011/09/10

Report on participation in the 9th Convention of JART (Japan Association for Research on Testing) in Okayama

This is a report on our participation in the 9th Convention of JART held at Benesse Corporation Headquarters and at Okayama University.  The theme of the Convention was "Testing in Education – Today and the Future." Two open symposia were held with the topics of "Dynamic Testing Technology to Watch over Children" and "Global Perspectives of Educational Testing Today and in the Future."...

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2011/07/04

Report on ICT-integrated Education in Hong Kong and the CSCL conference

 The 21st century has witnessed various paradigm shifts in how we perceive learning and skills. In a new paradigm, more emphasis is placed on the students’ proactive and collaborative learning, rather than traditional teaching led by teachers. Emphasis is also placed on “higher order thinking skills” which empowers students to do critical thinking and problem solving. On the...

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Areas of Reasearch in CRET

This laboratory conducts research on test evaluation and analysis. We also perform joint research and exchange programs with overseas testing research institutes.







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This laboratory conducts research and development into testing approaches that measure communication skills, teamwork skills, and social skills, etc.

Dr. Atsushi Aikawa

Professor,
Faculty of Human Sciences,
University of Tsukuba
Ph.D. in Psychology

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This laboratory conducts research on the foundation of computer-based testing, and basic research on media and recognition, as well as applied and practical research
that utilize such knowledge.

Dr. Kanji Akahori

Professor Emeritus of
Tokyo Institute of
Technology

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